AWR and NI One Year Later...
 Thanks to an interview set up by Janine Love of T&M World shortly after IMS 2012 concluded, I was reminded that it has indeed been one year since AWR and NI joined forces. Rather than repeat the full interview Q&A exchange here, I encourage you to read it for yourself.
Somehow our one year anniversary has come and gone rather quickly in my mind. That’s simply because we have each remained focused on continuing to keep our respective businesses strong and have taken the time to work smart together by listening to our customers and pulling new opportunities and ideas from them.
Case in point, at IMS 2012 in June we jointly demonstrated integration of AWR’s Visual System Simulator™ (VSS) and NI’s LabVIEW within both of our booths for example applications like 802.11ac, radar and more. Earlier this month as well at NIWeek 2012, we demonstrated Behavioral Model Extraction: A Power Amplifier Example, which showcased a PXI system being used for power amplifier (PA) behavioral model extraction that also embraces AWR’s time delay neural network (TDNN) modeling.
As our second year as “A National Instruments Company” unfolds, you’ll see more fruits of our joint labors - not only on the product and technologies front but in the field at joint events and presentations too. On the event side, next up is the RF and Microwave Design and Test Symposium in September in UK and in November in France, the AWR Design Forum in China and Europe this autumn and European Microwave Week the last week in October.
I for one am excited about the future and the potential for great things from AWR combined with NI. And I truly hope you, our customers, are as well!
Sherry Hess, VP of Marketing, AWR
AWR Exhibits at NIWeek
A record-setting 3,400 people attended NIWeek 2012 earlier this month in Austin, Texas for a week long technical conference for the company's user and developer community. AWR had a good showing within the RF and Wireless Pavilion, demonstrating three AWR Connected™ to National Instruments applications:
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Behavioral Model Extraction: A Power Amplifier Example – a PXI system was used for PA behavioral model extraction with AWR’s time delay neural network (TDNN) modeling within VSS system design software.
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Signal Processing with VSS and LabVIEW: An 802.11ac Example - the ability of VSS to call LabVIEW directly via a virtual instrument (VI) server interface such that additional/custom signal processing blocks are readily extended into the VSS environment.
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Design through Test: An Amplifier Example – how an amplifier designer can easily move from the design stage through to test, with results validated between simulation and measurements along the way. Microwave Office™ was used for circuit simulation, LabVIEW for signal processing and virtual control of hardware of NI's PXI instrumentation, and VSS for system-level simulation of the amplifier.
In addition, NI also presented a talk that highlights our recent synergies at Texas Tech University. This presentation explored how a Texas Tech microwave engineering course challenged students to design, lay out, and simulate their tumor tracking radar system for lung cancer radiotherapy within the AWR Design Environment™. Students then created a test bench for the system within NI LabVIEW and took measurements with the final prototype with NI PXI RF instruments.
RF/Microwave Design & Test Symposium
AWR will join National Instruments as a host of the RF and Microwave Design and Test Symposium 2012. In this free full-day seminar, you can choose between two tracks, either focusing on RF test and measurement with NI, or RF and microwave design with AWR.
Locations and dates are:
AWR IMS MicroApps Now on AWR.TV
Nine videos of AWR and partner MicroApps presentations from the International Microwave Symposium (IMS) 2012 are now available for viewing at the AWR.TV portal. Tune into the IMS channel to view the following AWR MicroApps presentations:
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Optimizing the Design and Verification of 4G RF Power Amplifiers
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Simulating an NXP Doherty Power Amplifier with DPD
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RF Link Prediction - A New and Novel Approach
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Fully Integrating 3D EM Simulation into Circuit Simulation
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RF System Design - Moving beyond a Linear Datasheet
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System Simulation Featuring Signal Processing Blocks
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Linking RF Design Through to Test
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Electrical/Thermal Coupled Solutions for Flip Chip Designs
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Microwave Circuit Design-Passive Model Yield/Sensitivity Analysis
New Product Literature
Updated Product Brochures: Microwave Office, VSS, AXIEM, Analog Office, and Analyst.
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Upcoming Events
INMMIC 2012
(Integrated Nonlinear Microwave and Millimeter Wave Circuits)
Sept. 3-4, Dublin Ireland
MMS 2012
(Mediterranean Microwave Symposium)
Sept. 2–5, Istanbul Turkey
ADF Europe
Sept. 11 – Nov. 29
NI Design & Test Symposium
Hitchin, UK - Sept. 11
Newbury, UK - Sept. 13
Paris, France - Nov. 27
Rennes, France - Nov. 29
ADF China
Xi'an, Sept. 25
Chengdu, Sept. 27
Engineering TV, July 2012 - LabVIEW in the AWR Visual System Simulator Environment
Test & Measurement World, August 2012 - NI and AWR: What’s happening one year after the merger
Control Design, August 22, 2012 - ’Software-Design’ Instrument Sets New Benchmarks at NIWeek
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AWR Online Resources
AWR Website
AWR.TV
AWR Knowledge Base
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AWR on Social Media
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