LNA Design and Characterization Using Modern RF/Microwave Software Together with T&M Instruments
Date & Time
March 8, 2011 - 9am PST/ 12pm EST/ 5pm UTC
- Matthias Beer, Product Mgmt, Network Analyzers, Rohde & Schwarz GmbH & Co. KG
- Jaakko Juntunen, Head of EM Applications, AWR Corp.
The ubiquitous Low Noise Amplifier (LNA) is often designed around discrete transistors, which are reaching the sub-dB noise figure range at RF and microwave frequencies. LNA designers must provide device stability, bias circuitry, and impedance matching while achieving an optimum tradeoff between gain and noise figure. Using a modern design tool like AWR's Microwave Office® allows designers to create a virtual model of the prototype and study its electrical performance, including the parasitic effects from the physical layout. Despite its accuracy, the virtual model eventually needs to be verified by a real device. This verification is the domain of test and measurement.
In this webcast, Microwave Office is used to demonstrate the virtual prototype design stage with a focus on common LNA design concerns, revealing and quantifying sensitive circuit parameters. From these results, an actual LNA prototype is fabricated and characterized using a ZVA, R&S Vector Network Analyzer. Microwave Office and the ZVA data are integrated to bring the measured and simulated results together for instantaneous comparison and virtual model verification. In addition to linear S-parameters, certain non-linear figures of merit, such as gain compression and inter-modulation are also performed both through simulation and measurement for comparison. Moreover, noise figure characterization is performed as a standard ZVA measurement without the need for a characterized noise source.
AWR is sponsoring this Webinar
Head of EM Applications