AWR's Dr. John Dunn Authors Guest Column for RF Globalnet on “Electromagnetic Simulation: Tips, Tricks, & Tradeoffs”
El Segundo, CA - January 24, 2011
AWR® Corporation's Dr. John Dunn will contribute regularly to a guest column series for VertMarkets, Inc.'s RF Globalnet on "Electromagnetic (EM) Simulation: Tips, Tricks & Tradeoffs." The first article will launch on January 25th and is titled, "The Trouble with EM Is That It Always Gives an Answer." This aim of the series is to discuss the issues that today's design engineers face while using EM simulation tools and to provide useful and practical advice, tips and tactics that improve design accuracy and turn-around times whether the EM tool user is a novice, casual and/or power user.
Dr. Dunn is a recognized expert in electromagnetic modeling and simulation for high-speed circuit applications. Before joining AWR, he was head of the Interconnect Modeling Group at Tektronix and earlier was a professor of electrical engineering at the University of Colorado, where he led a research group in electromagnetic simulation and modeling. Dr. Dunn received his BA degree in physics from Carleton College and his MS and PhD degrees in applied physics from Harvard University.
Where: Online at www.rfglobalnet.com in the Featured Articles and Guest Column sections.
When: This first article will appear on January 25, 2011.
Dr. John Dunn