• Press Releases
• Articles
• Newsletters
• Events
• AWR TV
• AWR on Facebook
• AWR on Twitter
• AWR on Youtube
• AWR on Linkedin

AWR White Paper Brings Emerging Nonlinear Device Models into Focus

The Story: AWR Corporation has released a new white paper entitled "AWR Nonlinear Modeling, AWR's Support of Polyharmonic Distortion and Nonlinear Behavioral Models." The white paper provides comprehensive information about rapidly-emerging nonlinear models and measurement systems and how AWR's Microwave Office® high-frequency design software effectively employs them.

Linear and nonlinear device models, the building blocks of most RF and microwave designs, are costly and time-consuming to develop. As most compact model parameters are extracted from linear, 50-ohm S-parameters and DC IV data, their ability to predict behavior under extreme nonlinear conditions or non-50 ohm terminations is unreliable. These issues, along with the fact that model quality varies greatly among device manufacturers, presents a major dilemma for circuit designers. Fortunately, recent developments in measurement and modeling technology are focusing on technology-independent, measurement-based black box models. This white paper is a comprehensive resource about all of these models, the latest developments, and the efforts of the various participating companies.

The white paper is available for download at http://web.awrcorp.com/Usa/Products/Microwave-Office.